• DocumentCode
    958177
  • Title

    Hot-electron injection in AlGaSb/GaSb HBT-its relation to the conduction band structure of GaSb

  • Author

    Furukawa, A. ; Mizuta, M.

  • Author_Institution
    NEC Corp., Kanagawa, Japan
  • Volume
    36
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    2602
  • Abstract
    Summary form only given. The authors report on hot-electron injection in the AlGaSb/GaSb heterojunction bipolar transistor (HBT). It is revealed that the current gain is strongly dependent on conduction band discontinuity at the emitter-base junction. This is discussed in relation to the hot-electron injection and the conduction band structure of GaSb base material. The current gain ( beta ) measured at room temperature was found to increase monotonically from 8 (y0=0) to as high as 160 (y0=0.5). An increase in beta up to y0=0.5 can be interpreted as an increased initial velocity due to electron injection with large kinetic energy into the L-band of the base. The use of the y0 equivalent to 0.5 emitter has been shown to provide high beta and short transit time in the base AlGaSb/GaSb HBT structure.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; heterojunction bipolar transistors; hot electron transistors; semiconductor technology; AlGaSb-GaSb; GaSb base material; HBT; conduction band discontinuity; conduction band structure; current gain; emitter-base junction; heterojunction bipolar transistor; hot-electron injection; increased initial velocity; room temperature; short transit time; Bipolar transistors; Circuits; Conducting materials; Current measurement; Cutoff frequency; Electron emission; Energy consumption; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Kinetic energy; L-band; Microwave devices; Secondary generated hot electron injection; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43697
  • Filename
    43697