DocumentCode
958177
Title
Hot-electron injection in AlGaSb/GaSb HBT-its relation to the conduction band structure of GaSb
Author
Furukawa, A. ; Mizuta, M.
Author_Institution
NEC Corp., Kanagawa, Japan
Volume
36
Issue
11
fYear
1989
fDate
11/1/1989 12:00:00 AM
Firstpage
2602
Abstract
Summary form only given. The authors report on hot-electron injection in the AlGaSb/GaSb heterojunction bipolar transistor (HBT). It is revealed that the current gain is strongly dependent on conduction band discontinuity at the emitter-base junction. This is discussed in relation to the hot-electron injection and the conduction band structure of GaSb base material. The current gain ( beta ) measured at room temperature was found to increase monotonically from 8 (y0=0) to as high as 160 (y0=0.5). An increase in beta up to y0=0.5 can be interpreted as an increased initial velocity due to electron injection with large kinetic energy into the L-band of the base. The use of the y0 equivalent to 0.5 emitter has been shown to provide high beta and short transit time in the base AlGaSb/GaSb HBT structure.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; heterojunction bipolar transistors; hot electron transistors; semiconductor technology; AlGaSb-GaSb; GaSb base material; HBT; conduction band discontinuity; conduction band structure; current gain; emitter-base junction; heterojunction bipolar transistor; hot-electron injection; increased initial velocity; room temperature; short transit time; Bipolar transistors; Circuits; Conducting materials; Current measurement; Cutoff frequency; Electron emission; Energy consumption; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Kinetic energy; L-band; Microwave devices; Secondary generated hot electron injection; Temperature measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.43697
Filename
43697
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