Title :
Statistical approach to reduction of circuit performance variability
Author :
Ilumoka, A. ; Spence, R.
Author_Institution :
Imperial College of Science & Technology, Department of Electrical Engineering, London, UK
Abstract :
A statistical method is described for reducing the variance observed in the response of a circuit due to tolerances on circuit parameters.
Keywords :
Monte Carlo methods; circuit reliability; network synthesis; reliability theory; statistical analysis; Monte Carlo method; circuit performance variability; circuit yield; reliability theory; statistical method;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19800540
