Title :
A Model for Pattern Recognition Systems with Binary Pattern Vectors
Author :
Brown, W. G. S. ; Parrish, E. A.
Author_Institution :
Applied Systems Technology, Springfield, Va.
Keywords :
Algorithm design and analysis; Character recognition; Distortion measurement; Electrons; Logic design; Pattern recognition; Prototypes; Rubber; Tellurium; Testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1972.5008931
