• DocumentCode
    958459
  • Title

    Strained-layer InGaAs-GaAs-AlGaAs graded-index separate-confinement single quantum well lasers grown by molecular-beam epitaxy

  • Author

    Schaff, W.J. ; Tasker, P.J. ; Eastman, L.F.

  • Volume
    36
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    2608
  • Abstract
    Strained-layer Ga0.7In0.3As-AlGaAs-GaAs graded-index separate-confinement heterostructure single-quantum-well lasers were grown by molecular-beam epitaxy with growth conditions selected to optimize the growth of each material. The lasers emit at a wavelength of 1.03 mu m at 300 K, have threshold currents of 12 mA for 3 mu m*400 mu m devices, and have average threshold current densities of 174 A/cm2 for 40 mu m*800 mu m devices. Studies of threshold current versus cavity length and width agree with theoretical formulations. The threshold currents for lasers of various lengths and widths are significantly lower than those for previous strained-layer lasers grown by molecular-beam epitaxy and lower than those for strained-layer lasers grown by organometallic vapor-phase epitaxy. Although these devices have not been optimized for microwave modulation, 4-GHz bandwidths have been measured for 21.5 mu m*600 mu m devices.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; gradient index optics; indium compounds; integrated optics; molecular beam epitaxial growth; semiconductor growth; semiconductor junction lasers; semiconductor quantum wells; 1.03 micron; 12 mA; 300 K; 4 GHz; GRIN-SCH structure; Ga0.7In0.3As-AlGaAs-GaAs; MBE; cavity length; cavity width; graded-index; growth conditions; molecular-beam epitaxy; semiconductor lasers; separate-confinement heterostructure; single quantum well lasers; threshold currents; Bandwidth; Epitaxial growth; Laser theory; Masers; Microwave devices; Microwave measurements; Molecular beam epitaxial growth; Optical materials; Quantum well lasers; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43714
  • Filename
    43714