Title :
Comment on "A Nonlinear Mapping for Data Structure Analysis
Author_Institution :
Electronics Research Laboratory, Plessey Company, Havant, England.
Abstract :
An alternative metric for use with Sammon´s nonlinear mapping is suggested. Rather than Euclidean, the Hamming metric is proposed as a means of reducing the iteration time.
Keywords :
Arrays; Computers; Distance measurement; Electrical engineering; Euclidean distance; Pattern recognition; Training; Dimensionality; mapping; multivariant data analysis; pattern recognition;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1972.5008933
