• DocumentCode
    958554
  • Title

    Recent Studies on the Physics of Electrical Connector Surfaces

  • Author

    Williamson, J.

  • Author_Institution
    Burndy Corporation,Norwalk, Conn.
  • Issue
    3
  • fYear
    1966
  • fDate
    9/1/1966 12:00:00 AM
  • Firstpage
    71
  • Lastpage
    75
  • Abstract
    The manner in which two conductors touch to form an electrical contact is described, and the influence of the phenomena occurring at the interface on the engineering properties of the connector is discussed. In the last ten years, significant advances have been made in our knowledge of the mechanical, electrical, and thermal aspects of the contact between surfaces. These have led to a better understanding of the deterioration processes which occur naturally in connectors. A new philosophy of the evaluation and specification of connectors which utilizes these results and which links the engineering reliability of the device to the basic science of the interface is discussed.
  • Keywords
    Asperities; Connectors; Constriction resistance; Contact resistance (CR); Contacts; Elastic deformation; Failure mechanisms; Melting voltage; Plastic deformation; Profilometer; Roughness; Topography; Circuits; Communication industry; Conducting materials; Conductors; Connectors; Contact resistance; Packaging; Physics; Surface topography; Voltage;
  • fLanguage
    English
  • Journal_Title
    Parts, Materials and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9502
  • Type

    jour

  • DOI
    10.1109/TPMP.1966.1135557
  • Filename
    1135557