Title :
Comments on "The large-scale manipulation of small particles"
Author :
Wellington, Thomas D.
Author_Institution :
S. G. Frantz Co., Inc., Trenton, NJ
fDate :
9/1/1976 12:00:00 AM
Keywords :
Bit error rate; Circuit testing; Large-scale systems; Magnetic circuits; Magnetic flux; Magnetic recording; Magnetic separation; Modulation coding; Saturation magnetization; Steel;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1976.1059090