DocumentCode :
958954
Title :
Author´s reply
Author :
Koh, Kyung Shik
Author_Institution :
Department of Electrical Engineering, Inha Institute of Technology, Inchon, Korea.
Issue :
4
fYear :
1972
fDate :
4/1/1972 12:00:00 AM
Firstpage :
408
Lastpage :
408
Keywords :
Correlation; Feature extraction; Minimization; Pattern classification; Pattern recognition; Probability density function; Radiation detectors;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1972.5008988
Filename :
5008988
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=958954