Title :
Comments on "Feature Selection with a Linear Dependence Measure
Author :
Toussaint, Godfried T. ; Vilmansen, Toomas R.
Author_Institution :
Department or Electrical Engineering, University of British Columbia, Vancouver 8, B. C., Canada.
fDate :
4/1/1972 12:00:00 AM
Keywords :
Correlation; Feature extraction; Minimization; Pattern classification; Pattern recognition; Probability density function; Radiation detectors;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1972.5008989
