Numerical Analysis of the Resistance of Interference-Fit Pin Connections

A three-dimensional analysis is presented for the resistance of an interference-fit pin connection in a plated-through hole. The analysis examines the electric potential distribution resulting from the application of a four-wire resistance measurement method. In light of the resultant potential distributions, the utility of the test method is discussed and found to give variable results with respect to resistance changes of the pin and plated-through hole contact. Actual resistance changes are generally underestimated by a factor of four or less. For large changes in resistance of the order of 300 muOmega, this method is acceptable since the underestimation factor is fairly constant and is approximately equal to unity.