• DocumentCode
    959295
  • Title

    Computer Control and Data Management in an LSI Fabrication Facility

  • Author

    Doyal, Leg A. ; Weaver, Douglas L. ; Gwyn, Charles W.

  • Author_Institution
    Sandia National Laboratories, NM
  • Volume
    3
  • Issue
    3
  • fYear
    1980
  • fDate
    9/1/1980 12:00:00 AM
  • Firstpage
    339
  • Lastpage
    344
  • Abstract
    A minicomputer system is used to control diffusion furnaces, monitor temperatures, provide operator instructions for each processing step, and record detailed process histories for wafer lots fabricated in the Sandia Semiconductor Development Laboratory. The system provides a complete data base for laboratory operations, a variety of displays describing equipment status, scheduling and utilization summaries for equipment, wafer and mask inventories, and laboratory management information. The wafer lot history includes a record indicating the operator, time, date, and specification recipe for each process step, special notes summarizing process deviations, results of inspection steps, and in-line capacitance, oxide thickness, or resistivity measurements.
  • Keywords
    Integrated circuit fabrication; Management information systems; Manufacturing data processing; Minicomputer applications; Process control; Control systems; Fabrication; Furnaces; History; Laboratories; Large scale integration; Microcomputers; Temperature control; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1980.1135636
  • Filename
    1135636