DocumentCode
959295
Title
Computer Control and Data Management in an LSI Fabrication Facility
Author
Doyal, Leg A. ; Weaver, Douglas L. ; Gwyn, Charles W.
Author_Institution
Sandia National Laboratories, NM
Volume
3
Issue
3
fYear
1980
fDate
9/1/1980 12:00:00 AM
Firstpage
339
Lastpage
344
Abstract
A minicomputer system is used to control diffusion furnaces, monitor temperatures, provide operator instructions for each processing step, and record detailed process histories for wafer lots fabricated in the Sandia Semiconductor Development Laboratory. The system provides a complete data base for laboratory operations, a variety of displays describing equipment status, scheduling and utilization summaries for equipment, wafer and mask inventories, and laboratory management information. The wafer lot history includes a record indicating the operator, time, date, and specification recipe for each process step, special notes summarizing process deviations, results of inspection steps, and in-line capacitance, oxide thickness, or resistivity measurements.
Keywords
Integrated circuit fabrication; Management information systems; Manufacturing data processing; Minicomputer applications; Process control; Control systems; Fabrication; Furnaces; History; Laboratories; Large scale integration; Microcomputers; Temperature control; Temperature measurement; Temperature sensors;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1980.1135636
Filename
1135636
Link To Document