DocumentCode
959322
Title
Post-layout timing simulation of CMOS circuits
Author
Deschacht, Denis ; Robert, Michel ; Azemard-Crestani, N. ; Auvergne, Daniel
Author_Institution
Lab. d´´Autom. & de Microelectron. de Montpellier, France
Volume
12
Issue
8
fYear
1993
fDate
8/1/1993 12:00:00 AM
Firstpage
1170
Lastpage
1177
Abstract
As a necessary aid to system integration, the authors present the implementation and performance of a pattern-dependent timing simulator, PATH-RUNNER. Organized around an explicit formulation of delays, this is an event-driven simulator which processes only transitions with gates controlled by events. Extraction of conduction paths from a general decomposition of data paths in unidirectional blocks allows general conflictual situations to be solved. Configuration problems detected during the evaluation, such as pulse rejection and strength conflicts, are illustrated, and effective solutions of conflictual configurations are given. It is shown that the implementation of a two-pass algorithm results in a significant improvement of speed. Execution times have been found to be nearly linear with the node numbers. Comparison of simulation times obtained from other timing simulators is given. SPICE compatibilities of PATH-RUNNER allow automatic real characterization of data paths from post-layout extracted net lists, with SPICE-like accuracy for evaluation of delays on real structures
Keywords
CMOS integrated circuits; circuit analysis computing; circuit layout CAD; integrated logic circuits; logic CAD; CMOS circuits; PATH-RUNNER; SPICE compatibilities; conduction paths; data paths; event-driven simulator; pattern-dependent timing simulator; post-layout extracted net lists; pulse rejection; strength conflicts; two-pass algorithm; unidirectional blocks; Analytical models; Circuit simulation; Data mining; Fabrication; Logic circuits; Propagation delay; SPICE; Switching circuits; Timing; Very large scale integration;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.238609
Filename
238609
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