DocumentCode
959389
Title
Drift reliability optimization in IC design: generalized formulation and practical examples
Author
Styblinski, M.A. ; Huang, Min
Author_Institution
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Volume
12
Issue
8
fYear
1993
fDate
8/1/1993 12:00:00 AM
Firstpage
1242
Lastpage
1252
Abstract
A generalized formulation of the drift reliability optimization problem is presented. Algorithmic solutions are also proposed. They can be implemented readily in the existing circuit optimization environments and applied to integrated circuit design. Such applications are demonstrated, considering degradations due to hot electron effects. The results show that the proposed approach can significantly increase long-term circuit reliability and increase its robustness
Keywords
circuit CAD; circuit reliability; hot carriers; integrated circuit technology; optimisation; IC design; circuit optimization environments; drift reliability optimization; hot electron effects; integrated circuit design; Circuit optimization; Circuit simulation; Computational modeling; Degradation; Design optimization; Electrons; Failure analysis; Integrated circuit reliability; Life estimation; Lifetime estimation;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.238616
Filename
238616
Link To Document