Title :
Physical Interpretation of the Tantalum Chip Capacitor Life-Test Results
Author_Institution :
Hughes Aircraft Company,CA
fDate :
12/1/1980 12:00:00 AM
Abstract :
Tantalum chip capacitors that survived accelerated life tests at 85°C and 2.5 times the rated voltage exhibited different dc electrical relationships prior to the accelerated life tests than did tantalum chip capacitors that failed the tests. This useful dc characterization may be interpreted in terms of the presence of an effcient blocking barrier between the MnO2cathode and the Ta205dielectric film in good capacitors and the absence of the barrier in defective capacitors.
Keywords :
Capacitors; Life testing; Tantalum devices; Capacitors; Cathodes; Dielectric films; Dielectric measurements; Electrodes; Life estimation; Life testing; Low voltage; Semiconductor device measurement; Semiconductor films;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1980.1135658