DocumentCode :
959505
Title :
Physical Interpretation of the Tantalum Chip Capacitor Life-Test Results
Author :
Loh, Eugene
Author_Institution :
Hughes Aircraft Company,CA
Volume :
3
Issue :
4
fYear :
1980
fDate :
12/1/1980 12:00:00 AM
Firstpage :
647
Lastpage :
654
Abstract :
Tantalum chip capacitors that survived accelerated life tests at 85°C and 2.5 times the rated voltage exhibited different dc electrical relationships prior to the accelerated life tests than did tantalum chip capacitors that failed the tests. This useful dc characterization may be interpreted in terms of the presence of an effcient blocking barrier between the MnO2cathode and the Ta205dielectric film in good capacitors and the absence of the barrier in defective capacitors.
Keywords :
Capacitors; Life testing; Tantalum devices; Capacitors; Cathodes; Dielectric films; Dielectric measurements; Electrodes; Life estimation; Life testing; Low voltage; Semiconductor device measurement; Semiconductor films;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1980.1135658
Filename :
1135658
Link To Document :
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