DocumentCode
959589
Title
Thermal Transients in Electronic Packages
Author
Buller, M. Lawrence
Author_Institution
IBM Corp.,Austin,TX
Volume
3
Issue
4
fYear
1980
fDate
12/1/1980 12:00:00 AM
Firstpage
588
Lastpage
594
Abstract
The use of a transient analysis to accurately characterize the operating temperature of electronic modules should result in lower temperature estimates. This will reflect increases in both the reliability estimates and the performance specifications. An accurate cooling analysis would also enhance the projected product life or reduce the system cooling requirements. Simplified expressions have been obtained for the calculation of chip and module thermal transients which, when superimposed, characterize the total package time/temperature response. Empirical data demonstrate the validity of the assumptions used to obtain these expressions. The thermal time constants are also presented in graphical form using parameters easily obtainable by the design engineer (e.g., cooling air velocity, steadystate temperature differences, and module location) so that order of magnitude assessments can be made.
Keywords
Integrated circuit packaging; Integrated circuit reliability; Integrated circuit thermal factors; Boundary conditions; Costs; Electronic components; Electronic packaging thermal management; Electronics cooling; Steady-state; Temperature; Thermal engineering; Time factors; Transient analysis;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1980.1135667
Filename
1135667
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