• DocumentCode
    959589
  • Title

    Thermal Transients in Electronic Packages

  • Author

    Buller, M. Lawrence

  • Author_Institution
    IBM Corp.,Austin,TX
  • Volume
    3
  • Issue
    4
  • fYear
    1980
  • fDate
    12/1/1980 12:00:00 AM
  • Firstpage
    588
  • Lastpage
    594
  • Abstract
    The use of a transient analysis to accurately characterize the operating temperature of electronic modules should result in lower temperature estimates. This will reflect increases in both the reliability estimates and the performance specifications. An accurate cooling analysis would also enhance the projected product life or reduce the system cooling requirements. Simplified expressions have been obtained for the calculation of chip and module thermal transients which, when superimposed, characterize the total package time/temperature response. Empirical data demonstrate the validity of the assumptions used to obtain these expressions. The thermal time constants are also presented in graphical form using parameters easily obtainable by the design engineer (e.g., cooling air velocity, steadystate temperature differences, and module location) so that order of magnitude assessments can be made.
  • Keywords
    Integrated circuit packaging; Integrated circuit reliability; Integrated circuit thermal factors; Boundary conditions; Costs; Electronic components; Electronic packaging thermal management; Electronics cooling; Steady-state; Temperature; Thermal engineering; Time factors; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1980.1135667
  • Filename
    1135667