• DocumentCode
    959613
  • Title

    Special issue of IEEE Transactions on Electron Devices

  • Volume
    8
  • Issue
    3
  • fYear
    2008
  • Firstpage
    629
  • Lastpage
    629
  • Abstract
    Provides notice of upcoming special issue(s) of interest to practitioners and researchers.
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2008.2007623
  • Filename
    4655576
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=959613