مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

959832

Title :

Author´s reply

Author :

Chu, John T.

Author_Institution :

Department of Industrial Engineering and Operations Research, New York University, Bronx, N. Y. 10453.

Issue :

fYear :

1972

Firstpage :

1027

Lastpage :

1028

Keywords :

Error analysis; Error probability; Estimation; Pattern recognition; Probability density function; Upper bound;

fLanguage :

English

Journal_Title :

Computers, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9340

Type :

jour

DOI :

10.1109/TC.1972.5009088

Filename :

5009088

Link To Document :