DocumentCode
960205
Title
On the Physics of Purple-Plague Formation, and the Observation of Purple Plague in Ultrasonically-Joined Gold-Aluminum Bonds
Author
Chen, Gordon K C
Author_Institution
Collins Radio Company of Canada,Canada
Volume
3
Issue
4
fYear
1967
fDate
12/1/1967 12:00:00 AM
Firstpage
149
Lastpage
153
Abstract
The gold wire-aluminum thin-film joint is treated as a diffusion couple at low concentration, but above dilute levels. Electrical resistance of the joint is directly related to the solute concentration and, therefore, is a measure of the thermal annealing process. Annealing temperatures are related through the diffusion length
Dt. Effects of temperature and time can be superimposed thereby. Experimental results on ultrasonically-joined gold wirealuminum thin films showed resistance increase with decreasing bond strength. From an Arrhenius-type plot at 105°C, 156°C, and 203°C, the apparent activation energy for thermal annealing of ultrasonically-joined gold wire-aluminum thin-film bonds is found to be 12.8 kcal/mole. The diffusion model is independent of the method by which the two metals are joined, however.
Dt. Effects of temperature and time can be superimposed thereby. Experimental results on ultrasonically-joined gold wirealuminum thin films showed resistance increase with decreasing bond strength. From an Arrhenius-type plot at 105°C, 156°C, and 203°C, the apparent activation energy for thermal annealing of ultrasonically-joined gold wire-aluminum thin-film bonds is found to be 12.8 kcal/mole. The diffusion model is independent of the method by which the two metals are joined, however.Keywords
Activation energy of gold-aluminum diffusion; Circuit interconnections; Diffusion of metals; Electrical resistance of multiphase solid; Failure mechanisms; Gold-aluminum diffusion; Lead attachments; Microelectronics; Physics-of-failure; Purple plague; Semiconductor device interconnections; Semiconductor device reliability; Time-temperature superposition; Ultrasonic wire bonding; Wire-thin-film joint; Annealing; Electric resistance; Electric variables measurement; Electrical resistance measurement; Gold; Physics; Temperature; Thermal resistance; Transistors; Ultrasonic variables measurement;
fLanguage
English
Journal_Title
Parts, Materials and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0018-9502
Type
jour
DOI
10.1109/TPMP.1967.1135733
Filename
1135733
Link To Document