DocumentCode
960221
Title
Dielectric Materials and Capacitor Miniaturization
Author
Mclean, David A.
Author_Institution
Bell Telephone Laboratories,Inc.,NJ
Volume
3
Issue
4
fYear
1967
fDate
12/1/1967 12:00:00 AM
Firstpage
163
Lastpage
169
Abstract
Capacitor improvements over the years have been largely identified with progress in dielectric materials. In this paper, emphasis is placed on miniaturization, especially as it relates to capacitor dielectrics. Modern capacitors can be divided into two general types: bulk capacitor types, most often used as discrete elements; and film capacitor types, which to date are exclusively single-layered and most useful in integrated thin-film networks. In bulk capacitor types, one strives for minimum volume, and the major volume factor is often the dielectric itself. A dielectric volume efficiency factor can be defined as eS2, where e is the dielectric constant and S is the permissible working stress. In some instances, as in electrolytic capacitors, electrode volume can also be appreciable. For film capacitor types, the area must be minimized and an area efficiency factor equal to eS is important. Consideration is given to contamination control, packaging, and novel structures.
Keywords
Electrolytic capacitors; Tantalum; Thin films; Titanates; Capacitance; Capacitors; Ceramics; Costs; Dielectric materials; Dielectric thin films; Electrodes; Equations; Packaging; Plastic films;
fLanguage
English
Journal_Title
Parts, Materials and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0018-9502
Type
jour
DOI
10.1109/TPMP.1967.1135735
Filename
1135735
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