• DocumentCode
    960221
  • Title

    Dielectric Materials and Capacitor Miniaturization

  • Author

    Mclean, David A.

  • Author_Institution
    Bell Telephone Laboratories,Inc.,NJ
  • Volume
    3
  • Issue
    4
  • fYear
    1967
  • fDate
    12/1/1967 12:00:00 AM
  • Firstpage
    163
  • Lastpage
    169
  • Abstract
    Capacitor improvements over the years have been largely identified with progress in dielectric materials. In this paper, emphasis is placed on miniaturization, especially as it relates to capacitor dielectrics. Modern capacitors can be divided into two general types: bulk capacitor types, most often used as discrete elements; and film capacitor types, which to date are exclusively single-layered and most useful in integrated thin-film networks. In bulk capacitor types, one strives for minimum volume, and the major volume factor is often the dielectric itself. A dielectric volume efficiency factor can be defined as eS2, where e is the dielectric constant and S is the permissible working stress. In some instances, as in electrolytic capacitors, electrode volume can also be appreciable. For film capacitor types, the area must be minimized and an area efficiency factor equal to eS is important. Consideration is given to contamination control, packaging, and novel structures.
  • Keywords
    Electrolytic capacitors; Tantalum; Thin films; Titanates; Capacitance; Capacitors; Ceramics; Costs; Dielectric materials; Dielectric thin films; Electrodes; Equations; Packaging; Plastic films;
  • fLanguage
    English
  • Journal_Title
    Parts, Materials and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9502
  • Type

    jour

  • DOI
    10.1109/TPMP.1967.1135735
  • Filename
    1135735