DocumentCode :
960621
Title :
Normal incidence GaAs/AlGaAs multiple-quantum-well polarization modulator using an induced uniaxial strain
Author :
Pamulapati, J. ; Shen, Haiying ; Wraback, M. ; Taysing-Lara, M. ; Dutta, Maitreyee ; Lu, Yang
Author_Institution :
US Army Res. Lab., Fort Monmouth, NJ
Volume :
40
Issue :
11
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
2144
Lastpage :
2145
Abstract :
Summary form only given. A demonstration of a novel polarization modulator with light incident normal to the surface of the modulator is reported. The layered pattern in a multiple quantum well (MQW) breaks the full cubic symmetry of the host materials. These structures, though, reserve a fourfold rotation symmetry about the growth axis normal to (100) oriented substrates. A uniaxial stress applied in the plane of the structure further reduces this rotation symmetry, mixing the heavy and light hole bands and creating an anisotropy in the in-plane components of the dielectric function, thus allowing the use of this device as a polarization modulator with a contrast ratio ~55:1 with a 5 V applied bias. A p-i-n structure grown on (100) GaAs was used for the modulator. The intrinsic region consists of a 100-period, 150-Å GaAs/50-Å Al0.1Ga0.9As MQW
Keywords :
III-V semiconductors; aluminium compounds; electro-optical devices; gallium arsenide; integrated optics; optical modulation; semiconductor quantum wells; (100) substrate; 150 angstroms; 5 V; 50 angstroms; GaAs-Al0.1Ga0.9As; MQW; anisotropy; cubic symmetry; dielectric function; fourfold rotation symmetry; hole bands; induced uniaxial strain; layered pattern; multiple-quantum-well polarization modulator; normal incidence modulator; p-i-n structure; semiconductor; uniaxial stress; Anisotropic magnetoresistance; Dielectric devices; Dielectric materials; Dielectric substrates; Gallium arsenide; Optical modulation; Optical polarization; PIN photodiodes; Quantum well devices; Stress;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.239834
Filename :
239834
Link To Document :
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