Title :
Decoupling capacitor effects on switching noise
Author :
Downing, R. ; Gebler, P. ; Katopis, George
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
fDate :
8/1/1993 12:00:00 AM
Abstract :
The experimental procedures and test vehicles used for the characterization of the decoupling capacitor efficiency in reducing the power supply differential switching noise of the multichip-module (MCM) package structure employed in the IBM ES/9000 system are described. The experimental results are summarized for various switching elements. It is demonstrated that careful design of the test vehicles, tester systems, and probes makes the accurate measurement of Delta-1 noise feasible. Experimental results on the BOBCAT tester show that the decoupling capacitor efficiency in reducing the peak of the differential Delta-1 noise is 50-67%. This efficiency can be increased by reducing the effective inductance in the decoupling capacitor current return path
Keywords :
capacitors; electric noise measurement; electron device testing; multichip modules; noise; switching; test equipment; BOBCAT tester; Delta-1 noise; IBM ES/9000 system; MCM; characterization; decoupling capacitor efficiency; multichip-module; package structure; switching noise; Capacitors; Circuit noise; Driver circuits; Inductance; Noise reduction; Packaging machines; Power supplies; Semiconductor device noise; Switches; Switching circuits;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on