• DocumentCode
    960704
  • Title

    Decoupling capacitor effects on switching noise

  • Author

    Downing, R. ; Gebler, P. ; Katopis, George

  • Author_Institution
    IBM Corp., Hopewell Junction, NY, USA
  • Volume
    16
  • Issue
    5
  • fYear
    1993
  • fDate
    8/1/1993 12:00:00 AM
  • Firstpage
    484
  • Lastpage
    489
  • Abstract
    The experimental procedures and test vehicles used for the characterization of the decoupling capacitor efficiency in reducing the power supply differential switching noise of the multichip-module (MCM) package structure employed in the IBM ES/9000 system are described. The experimental results are summarized for various switching elements. It is demonstrated that careful design of the test vehicles, tester systems, and probes makes the accurate measurement of Delta-1 noise feasible. Experimental results on the BOBCAT tester show that the decoupling capacitor efficiency in reducing the peak of the differential Delta-1 noise is 50-67%. This efficiency can be increased by reducing the effective inductance in the decoupling capacitor current return path
  • Keywords
    capacitors; electric noise measurement; electron device testing; multichip modules; noise; switching; test equipment; BOBCAT tester; Delta-1 noise; IBM ES/9000 system; MCM; characterization; decoupling capacitor efficiency; multichip-module; package structure; switching noise; Capacitors; Circuit noise; Driver circuits; Inductance; Noise reduction; Packaging machines; Power supplies; Semiconductor device noise; Switches; Switching circuits;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.239876
  • Filename
    239876