DocumentCode
960704
Title
Decoupling capacitor effects on switching noise
Author
Downing, R. ; Gebler, P. ; Katopis, George
Author_Institution
IBM Corp., Hopewell Junction, NY, USA
Volume
16
Issue
5
fYear
1993
fDate
8/1/1993 12:00:00 AM
Firstpage
484
Lastpage
489
Abstract
The experimental procedures and test vehicles used for the characterization of the decoupling capacitor efficiency in reducing the power supply differential switching noise of the multichip-module (MCM) package structure employed in the IBM ES/9000 system are described. The experimental results are summarized for various switching elements. It is demonstrated that careful design of the test vehicles, tester systems, and probes makes the accurate measurement of Delta-1 noise feasible. Experimental results on the BOBCAT tester show that the decoupling capacitor efficiency in reducing the peak of the differential Delta-1 noise is 50-67%. This efficiency can be increased by reducing the effective inductance in the decoupling capacitor current return path
Keywords
capacitors; electric noise measurement; electron device testing; multichip modules; noise; switching; test equipment; BOBCAT tester; Delta-1 noise; IBM ES/9000 system; MCM; characterization; decoupling capacitor efficiency; multichip-module; package structure; switching noise; Capacitors; Circuit noise; Driver circuits; Inductance; Noise reduction; Packaging machines; Power supplies; Semiconductor device noise; Switches; Switching circuits;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/33.239876
Filename
239876
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