• DocumentCode
    960767
  • Title

    Graphical Solution for the Back Pressurization Method of Hermetic Test

  • Author

    Ruthberg, Stanley

  • Author_Institution
    Electron Devices Division, DC
  • Volume
    4
  • Issue
    2
  • fYear
    1981
  • fDate
    6/1/1981 12:00:00 AM
  • Firstpage
    217
  • Lastpage
    224
  • Abstract
    The back pressurization method for leak-testing hermetically sealed electronic packages requires gas-flow modeling to relate indicated leakage rates to true leak size. The molecular flow relationship which is appropriate for fine leak sizes is nonlinear and requires a numerical solution, which in actual test application may involve either many trial calculations or the use of approximations that lead to limiting case values. A new graphical procedure is presented for complete solution of the molecular flow equation for any given test condition and package volume through the use of a single set of characteristic curves and a test line. The effects of repetitive testing and of prefill with tracer gas are also considered. The characteristic curves are appropriate for both the helium leak detector and the radioisotope methods of test, while the form of the test line distinguishes between the two methods.
  • Keywords
    Integrated circuit packaging; Integrated circuit testing; Components, packaging, and manufacturing technology; Detectors; Electronic equipment testing; Electronics packaging; Gases; Helium; Leak detection; Nonlinear equations; Radioactive materials; Semiconductor device packaging;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1981.1135792
  • Filename
    1135792