• DocumentCode
    960811
  • Title

    Numerical Electromagnetic Field Analysis for EMC Problems

  • Author

    Brüns, Heinz-Dietrich ; Schuster, Christian ; Singer, Hermann

  • Author_Institution
    Hamburg Univ. of Technol., Hamburg
  • Volume
    49
  • Issue
    2
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    253
  • Lastpage
    262
  • Abstract
    Much progress has been made in the use of computational electromagnetics for the analysis of electromagnetic compatibility (EMC) problems during recent years. This paper reviews the improvements in some of the most important techniques of the field: the method of moments, the finite-difference time-domain method, the finite-element method, the transmission-line matrix method, and the partial-element equivalent-circuit method. The results of computer codes on the basis of such methods have to be validated, and some of the respective possibilities are addressed.
  • Keywords
    computational electromagnetics; electromagnetic compatibility; electromagnetic field theory; finite difference time-domain analysis; finite element analysis; method of moments; transmission line matrix methods; EMC problems; computational electromagnetics; electromagnetic compatibility problems; finite-difference time-domain method; finite-element method; method of moments; numerical electromagnetic field analysis; partial-element equivalent-circuit method; transmission-line matrix method; Computational electromagnetics; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic fields; Finite difference methods; Finite element methods; Moment methods; Time domain analysis; Transmission line matrix methods; Transmission lines; Electromagnetic fields; finite-difference time-domain (FDTD) method; finite-element method (FEM); method of moments (MoM); partial-element equivalent-circuit (PEEC) method; transmission-line matrix (TLM) method; validation;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2007.897152
  • Filename
    4244577