Title :
Diffusion noise in double-injection diodes in the ohmic relaxation regime
Author :
Huang, C.H. ; van der Ziel, A. ; van Vliet, K.M.
Author_Institution :
University of Minnesota, Department of Electrical Engineering, Minneapolis, USA
Abstract :
A derivation is given for the effects of diffusion noise for double-injection diodes in the Ohmic relaxation regime. It leads to thermal noise of the d.c. resistance Va/Ia at high frequencies and a possible additional term similar to g¿r noise at low frequencies, whose existence is still in doubt.
Keywords :
diffusion; noise; semiconductor diodes; Fourier analysis; Langevins equation; diffusion noise; double injection noise; ohmic relaxation regime;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19710201
