• DocumentCode
    960842
  • Title

    Diffusion noise in double-injection diodes in the ohmic relaxation regime

  • Author

    Huang, C.H. ; van der Ziel, A. ; van Vliet, K.M.

  • Author_Institution
    University of Minnesota, Department of Electrical Engineering, Minneapolis, USA
  • Volume
    7
  • Issue
    11
  • fYear
    1971
  • Firstpage
    291
  • Lastpage
    292
  • Abstract
    A derivation is given for the effects of diffusion noise for double-injection diodes in the Ohmic relaxation regime. It leads to thermal noise of the d.c. resistance Va/Ia at high frequencies and a possible additional term similar to g¿r noise at low frequencies, whose existence is still in doubt.
  • Keywords
    diffusion; noise; semiconductor diodes; Fourier analysis; Langevins equation; diffusion noise; double injection noise; ohmic relaxation regime;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19710201
  • Filename
    4244581
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=960842