• DocumentCode
    960875
  • Title

    Tunneling, X-ray and electron diffraction studies of the structure of Nb3Ge films

  • Author

    Rowell, J.M. ; Schmidt, P.H. ; Spencer, E.G. ; Dernier, P.D. ; Joy, D.C.

  • Author_Institution
    Bell Laboratories, Murray Hill, NJ
  • Volume
    13
  • Issue
    1
  • fYear
    1977
  • fDate
    1/1/1977 12:00:00 AM
  • Firstpage
    644
  • Lastpage
    647
  • Abstract
    In an attempt to understand the structure of high TcNb3Ge films we have utilized tunneling, x-ray diffraction and transmission electron diffraction. Tunneling experiments indicate that such films have an appreciable highly disordered component. In x-ray diffraction, only two anomalous diffraction peaks are observed which are not sufficient to identify the unknown phase. The complex electron diffraction patterns are interpreted most easily as evidence for superlattice formation. Finally we show that large lattice expansions and depressions of Tcare produced when Nb3Ge films are exposed to hydrofluoric acid, presumably due to inclusion of hydrogen.
  • Keywords
    Conducting films; Superconducting materials; Electrons; Germanium; Impurities; Niobium compounds; Sputtering; Superconducting films; Superconducting transition temperature; Tunneling; Vacuum systems; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1977.1059304
  • Filename
    1059304