DocumentCode
960875
Title
Tunneling, X-ray and electron diffraction studies of the structure of Nb3 Ge films
Author
Rowell, J.M. ; Schmidt, P.H. ; Spencer, E.G. ; Dernier, P.D. ; Joy, D.C.
Author_Institution
Bell Laboratories, Murray Hill, NJ
Volume
13
Issue
1
fYear
1977
fDate
1/1/1977 12:00:00 AM
Firstpage
644
Lastpage
647
Abstract
In an attempt to understand the structure of high Tc Nb3 Ge films we have utilized tunneling, x-ray diffraction and transmission electron diffraction. Tunneling experiments indicate that such films have an appreciable highly disordered component. In x-ray diffraction, only two anomalous diffraction peaks are observed which are not sufficient to identify the unknown phase. The complex electron diffraction patterns are interpreted most easily as evidence for superlattice formation. Finally we show that large lattice expansions and depressions of Tc are produced when Nb3 Ge films are exposed to hydrofluoric acid, presumably due to inclusion of hydrogen.
Keywords
Conducting films; Superconducting materials; Electrons; Germanium; Impurities; Niobium compounds; Sputtering; Superconducting films; Superconducting transition temperature; Tunneling; Vacuum systems; X-ray diffraction;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1977.1059304
Filename
1059304
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