Title :
Reliability Index of Teleprocessing Tree Networks
Author :
Irao, V.V.Bapeswara ; Aatre, V.K.
Author_Institution :
Nova Scotia Technical College, Halifax, N.S., Canada.
Abstract :
A procedure to locate the center of communications in a teleprocessing tree network such that the reliability index is minimized is outlined.
Keywords :
Computer network reliability; Computer networks; Councils; Educational institutions; Flexible manufacturing systems; Joining processes; Notice of Violation; Radiography; Rails; Telecommunication network reliability; Reliability index; teleprocessing tree-networks;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1976.5009213
