DocumentCode :
960997
Title :
Evolution of organic chip packaging technology for high speed applications
Author :
Klink, Erich ; Garben, Bernd ; Huber, Andreas ; Kaller, Dierk ; Grivet-Talocia, Stefano ; Katopis, George A.
Author_Institution :
IBM Deutschland Entwicklung GmbH, Boeblingen, Germany
Volume :
27
Issue :
1
fYear :
2004
Firstpage :
4
Lastpage :
9
Abstract :
The high dense interconnect (HDI) organic chip packaging technology has made rapid development advancements in the last few years. Due to the dense wiring structures in the build up layers and the recently introduced fine line core with micro vias, high signal input/output (I/O) applications and dense chip area array footprints can be supported. These technology improvements support specific new dense chip applications. In this paper the electrical characteristics and the evolution of this packaging technology is described. The electrical description is especially focussed on material characteristics and the signal integrity including cross talk. In addition the impact on high speed data transmission and the performance differences between single-chip module (SCM) and multichip modules (MCM) are discussed. Also the power integrity is described on the basis of the results of a mid frequency power noise analysis.
Keywords :
chip scale packaging; chip-on-board packaging; high-speed integrated circuits; high-speed techniques; interconnections; multichip modules; HDI; I-O applications; MCM; SCM; cross talk; dense chip area array footprints; dense wiring structures; electrical characteristics; fine line core; high dense interconnect; high signal input-output; high speed applications; high speed data transmission; material characteristics; micro vias; multichip modules; organic chip packaging technology; power integrity; power noise analysis; signal integrity; single-chip module; Bonding; Data communication; Electric variables; Frequency; Helium; Multichip modules; Packaging; Signal generators; Wire; Wiring;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2004.825457
Filename :
1288264
Link To Document :
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