DocumentCode :
961210
Title :
Effect of thermal cycling on the adhesion strength of Sn-9Zn-xAg-Cu interface
Author :
Chang, Tao-Chih ; Hon, Min-Hsiung ; Wang, Moo-Chin ; Lin, Dong-Yih
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Cheng Kung Univ., Taiwan, Taiwan
Volume :
27
Issue :
1
fYear :
2004
Firstpage :
158
Lastpage :
164
Abstract :
The effect of thermal cycling on the adhesion strength of the Sn-9Zn-xAg-Cu interface has been investigated by using pull-off tester, X-ray diffractometer, scanning electron microscope and energy dispersive spectrometer. The Sn-9Zn-xAg lead-free solders offer a better thermal cyclic resistance than the 63Sn-37Pb and Sn-9Zn solder alloys. The adhesion strength of the Sn-9Zn-Cu interface increases from 4.4 ± 0.4 MPa to 13.8 ± 0.9 MPa with increasing the thermal cycles from zero to three times but it decreases to 8.5 ± 0.8 MPa for five cycles. The Sn-9Zn-xAg solder alloys (x=0.5, 2.5, and 3.5 wt%) have a similar tendency and the maximum adhesion strength of 21.41 ± 1.5 MPa for the Sn-9Zn-2.5Ag solder alloy has been obtained after three thermal cycles. The adhesion strength of the Sn-9Zn-1.5Ag-Cu interface increases from 7.8 ± 0.6 to 16.6 ± 0.9 MPa with increasing the thermal cycles from 0 to 5 times.
Keywords :
X-ray diffractometers; adhesion; copper alloys; scanning electron microscopes; silver alloys; solders; spectrometers; thermal expansion; thermal resistance; tin alloys; zinc alloys; Sn-Zn-Ag-Cu; X-ray diffractometer; adhesion strength; energy dispersive spectrometer; interface; lead-free solder; pull-off tester; scanning electron microscope; thermal cyclic resistance; thermal cycling; Adhesives; Copper alloys; Environmentally friendly manufacturing techniques; Lead; Morphology; Soldering; Thermal expansion; Thermal resistance; Thermal stresses; Tin;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2004.825377
Filename :
1288281
Link To Document :
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