DocumentCode :
961253
Title :
Observation of quantum coherence properties of the hot electron
Author :
Miyamoto, Yutaka ; Uesaka, Katsumi ; Yamaura, Shingo ; Furuya, Keiichi
Author_Institution :
Tokyo Inst. of Technol., Japan
Volume :
36
Issue :
11
fYear :
1989
fDate :
11/1/1989 12:00:00 AM
Firstpage :
2620
Abstract :
Summary form only given. The authors report the quantum coherence properties of hot electrons for GaInAs/InP systems. They obtained these properties along a path length as long as 280 nm at 77 K, the longest coherent length ever reported. The device used for the observation was a hot-electron transistor. The common-base emitter current-voltage characteristic was observed at 77 K when the collector-base voltage VCB is zero. To confirm the quantum interference effect, the authors evaluated this characteristic by the first derivative. Three obvious peaks at 0.04, 0.08, and 0.15 V were observed under 0.2 V, and oscillations with a short period were observed when the applied voltage was over 0.2 V. Forty-eight oscillations were observed between 0.2 and 0.4 V. Three peaks under 0.2 V occurred due to the quantum interference effect in the base region. The period of peaks above 0.2 V was very short in comparison with those below 0.2 V. This threshold voltage, 0.2 V, agrees with the band discontinuity of GaInAs/InP systems. Thus it was judged that the oscillation above 0.2 V occurred due to the quantum interference effect in the InP collector barrier.
Keywords :
III-V semiconductors; gallium arsenide; hot carriers; hot electron transistors; indium compounds; 0.2 to 0.4 V; 280 nm; 77 K; GaInAs-InP; InP collector barrier; applied voltage; band discontinuity; collector-base voltage; common-base emitter current-voltage characteristic; hot electrons; hot-electron transistor; oscillations; path length; quantum coherence properties; quantum interference effect; threshold voltage; Current-voltage characteristics; Electrons; Fabrication; Gallium arsenide; High-speed electronics; Indium phosphide; Interference; Power semiconductor switches; Reflection; Resonant frequency; Resonant tunneling devices; Springs; Switching circuits; Threshold voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.43741
Filename :
43741
Link To Document :
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