Title :
Surface Treatments and Bondability of Copper Thick Film Circuits
Author :
Liu, T.S. ; Pitkanen, David E. ; McIver, Chandler H.
Author_Institution :
Honeywell Inc., MN and Norththrop Corp., CA
fDate :
12/1/1981 12:00:00 AM
Abstract :
Crucial issues in using copper thick film microcircuits, namely, surface treatment and bondability, are addressed. A multilayer multichip ceramic substrate package with copper thick film conductors was used for these experiments. Surface treatments for bondability specific to different types of bonding sites are discussed. Using a flip tape automated bonding (TAB) technology, the resultant bond interfaces were analyzed in the as-bonded as well as thermally aged conditions. Results indicate a metallurgically stable materials system which should exhibit long-term reliability. Specific recommendations on copper surface treatments and general guidelines on materials selection are made on the production of reliable copper thick film interconnections.
Keywords :
Copper devices; Thick-film circuit bonding; Bonding; Ceramics; Conducting materials; Copper; Materials reliability; Nonhomogeneous media; Substrates; Surface treatment; Thick film circuits; Thick films;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1981.1135842