• DocumentCode
    961430
  • Title

    Influence of electrical and mechanical parameters on contact welding in low power switches

  • Author

    Neuhaus, Alexander R. ; Rieder, Werner F. ; Hammerschmidt, Martin

  • Author_Institution
    Inst. of Power Syst. & Energy Econ., Vienna Univ. of Technol., Wien, Austria
  • Volume
    27
  • Issue
    1
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    4
  • Lastpage
    11
  • Abstract
    A model switch has been developed to investigate the influence of kinetic parameters, as contact velocity and contact force, on contact welding under conditions prevailing in relays, micro switches etc. Both frequency and intensity of the statistically scattering weld forces increased with increasing arc duration and current. Pre-strike and bounce arcs show identical results under corresponding conditions. Both frequency and intensity of the statistically scattering weld forces initially increased and then decreased with increasing impact velocity. Increasing the static contact force hardly influenced the strength of the primary weld after impact but reduced or prevented weakening of the weld by a following bounce process. The results agree with the predictions of a mathematical model proposed. The configuration of the load circuit determining the actual arc current curve essentially influences the weld force values.
  • Keywords
    arcs (electric); electric current; electrical contacts; semiconductor device reliability; switches; welding; arc current; arc duration; bounce arcs; bounce process; contact velocity; contact welding; electrical parameters; impact velocity; kinetic parameters; load circuit; low power switches; mathematical model; mechanical parameters; model switch; prestrike arcs; static contact force; weld forces; Contacts; Frequency; Kinetic theory; Power generation economics; Power system economics; Scattering; Switches; Thermal force; Thermal stresses; Welding;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2004.825777
  • Filename
    1288299