• DocumentCode
    961435
  • Title

    On outage and error rate analysis of the ordered V-BLAST

  • Author

    Loyka, Sergey ; Gagnon, Francois

  • Author_Institution
    Sch. of Inf. Technol. & Eng., Univ. of Ottawa, Ottawa, ON
  • Volume
    7
  • Issue
    10
  • fYear
    2008
  • fDate
    10/1/2008 12:00:00 AM
  • Firstpage
    3679
  • Lastpage
    3685
  • Abstract
    Outage and error rate performance of the ordered BLAST with more than 2 transmit antennas is evaluated for i.i.d. Rayleigh fading channels. A number of lower and upper bounds on the 1st step outage probability at any SNR are derived, which are further used to obtain accurate approximations to average block and total error rates. For m Tx antennas, the effect of the optimal ordering at the first step is an m-fold SNR gain. As m increases to infinity, the BLER decreases to zero, which is a manifestation of the space-time autocoding effect in the V-BLAST. While the sub-optimal ordering (based on the before-projection SNR) suffers a few dB SNR penalty compared to the optimal one, it has a lower computational complexity and a 3 dB SNR gain compared to the unordered V-BLAST and can be an attractive solution for low-complexity/low-energy systems. Uncoded D-BLAST exhibits the same outage and error rate performance as that of the V-BLAST. An SNR penalty of the linear receiver interfaces compared to the BLAST is also analytically evaluated.
  • Keywords
    MIMO communication; Rayleigh channels; antennas; multiplexing; radio transmitters; MIMO; Rayleigh fading channel; autocoding effect; error rate analysis; ordered V-BLAST; outage analysis; sub optimal ordering; transmit antenna; Automatic programming; Closed-form solution; Computational complexity; Error analysis; Fading; Gain; H infinity control; Performance analysis; Transmitting antennas; Upper bound; Multi-antenna (MIMO) system, V-BLAST, performance analysis, autocoding effect;
  • fLanguage
    English
  • Journal_Title
    Wireless Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-1276
  • Type

    jour

  • DOI
    10.1109/T-WC.2008.070271
  • Filename
    4657310