Title :
The effects of material transfer in relays diagnosed by force and/or voltage measurement
Author :
Hammerschmidt, Martin ; Neuhaus, Alexander R. ; Rieder, Werner F.
Author_Institution :
Inst. of Power Syst. & Energy Econ., Vienna Univ. of Technol., Austria
fDate :
3/1/2004 12:00:00 AM
Abstract :
Material transfer may change the effective contact distance and/or jam the contacts delaying or even preventing contact opening. These effects can be recorded in an actual relay by measuring the contact force and/or the contact voltage during each operation. Proper recording and evaluation during life tests of relays may indicate the reasons and even the mechanisms of contact failures.
Keywords :
failure analysis; force measurement; semiconductor device measurement; semiconductor device testing; semiconductor relays; voltage measurement; contact distance; contact failures; contact force; contact opening; contact voltage; force measurement; life tests; material transfer; relays; voltage measurement; Contacts; Force measurement; Force sensors; Power generation economics; Power system economics; Protective relaying; Relays; Springs; Time measurement; Voltage measurement;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2004.825781
