Title :
A Note on Resistor Temperature Gradients in High Reliability Cordwood Packaging
Author :
Veilleux, Etienne ; Mark, Roger
fDate :
3/1/1968 12:00:00 AM
Keywords :
Annealing; Atmosphere; Copper alloys; Electron tubes; Hydrogen; Nickel; Packaging; Protection; Resistors; Temperature;
Journal_Title :
Parts, Materials and Packaging, IEEE Transactions on
DOI :
10.1109/TPMP.1968.1135884
