• DocumentCode
    961725
  • Title

    The Failure Mode and Lifetime of Static Contacts

  • Author

    Takano, Eisuke ; Mano, K.

  • Author_Institution
    Tohoku University,Japan
  • Volume
    4
  • Issue
    2
  • fYear
    1968
  • fDate
    6/1/1968 12:00:00 AM
  • Firstpage
    51
  • Lastpage
    55
  • Abstract
    This paper describes the failure mode due to corrosion at the contacting surfaces of static contacts in connectors and mechanical wiring connections. Copper static contacts with no mechanical separation fail to maintain electrical continuity when temperature-cycled from 20 to 200°C. Electron diffraction analysis and microscopic inspection show that this failure mode is due to growth of Cu2O film over all or part of the contacting surfaces. The lay? between the contact members is estimated to be 15 to 3250 A thick and the lifetime of the copper static contact at light loads is proportional to load.
  • Keywords
    Connectors; Contacts; Copper; Corrosion; Diffraction; Electron microscopy; Failure analysis; Inspection; Life estimation; Wiring;
  • fLanguage
    English
  • Journal_Title
    Parts, Materials and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9502
  • Type

    jour

  • DOI
    10.1109/TPMP.1968.1135887
  • Filename
    1135887