DocumentCode
961725
Title
The Failure Mode and Lifetime of Static Contacts
Author
Takano, Eisuke ; Mano, K.
Author_Institution
Tohoku University,Japan
Volume
4
Issue
2
fYear
1968
fDate
6/1/1968 12:00:00 AM
Firstpage
51
Lastpage
55
Abstract
This paper describes the failure mode due to corrosion at the contacting surfaces of static contacts in connectors and mechanical wiring connections. Copper static contacts with no mechanical separation fail to maintain electrical continuity when temperature-cycled from 20 to 200°C. Electron diffraction analysis and microscopic inspection show that this failure mode is due to growth of Cu2 O film over all or part of the contacting surfaces. The lay? between the contact members is estimated to be 15 to 3250 A thick and the lifetime of the copper static contact at light loads is proportional to load.
Keywords
Connectors; Contacts; Copper; Corrosion; Diffraction; Electron microscopy; Failure analysis; Inspection; Life estimation; Wiring;
fLanguage
English
Journal_Title
Parts, Materials and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0018-9502
Type
jour
DOI
10.1109/TPMP.1968.1135887
Filename
1135887
Link To Document