DocumentCode :
961777
Title :
A survey of heterojunction bipolar transistor (HBT) device reliability
Author :
Livingston, Henry
Author_Institution :
Inf. & Electron. Warfare Syst., BAE Systems, Nashua, NH, USA
Volume :
27
Issue :
1
fYear :
2004
fDate :
3/1/2004 12:00:00 AM
Firstpage :
225
Lastpage :
228
Abstract :
Heterojunction bipolar transistor (HBT) technology has become a major player in wireless communication, power amplifier, mixer, and frequency synthesizer applications. HBTs extend the advantages of silicon bipolar transistors to significantly higher frequencies. Since the mid-1980s, HBT technology development has focussed on reducing cost and improving reliability which, in turn, led to numerous commercial products, such as prescalers, gate arrays, digital-to-analog converters, mux/demux chip sets, logarithmic amplifiers, RF chip sets for CDMA wireless communication systems, and power amplifiers for cellular communications. They have become a natural choice for very high frequency military applications requiring a high current drive, high transconductance, high voltage handling capability, low noise oscillator, and uniform threshold voltage. Emerging HBT technologies allow the integration of a large quantity of high performance RF circuits and high speed digital circuits on a single chip. This paper provides an overview of HBT device reliability issues.
Keywords :
heterojunction bipolar transistors; integrated circuit reliability; semiconductor device reliability; HBT; heterojunction bipolar transistor; integrated circuit reliability; semiconductor device reliability; Frequency synthesizers; Heterojunction bipolar transistors; Mixers; Power amplifiers; Power system reliability; Radio frequency; Radiofrequency amplifiers; Silicon; Threshold voltage; Wireless communication;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2004.827642
Filename :
1288330
Link To Document :
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