DocumentCode :
961985
Title :
Fundamental limits on EMC
Author :
Showers, Ralph M. ; Schulz, Richard B. ; Lin, Shaw-Yueh
Author_Institution :
University of Pennsylvania, Philadelphia, PA
Volume :
69
Issue :
2
fYear :
1981
Firstpage :
183
Lastpage :
195
Abstract :
Both fundamental and state-of-the-art limits are treated, with emphasis on the former. Fundamental limits result from both natural and man-made electromagnetic noise which then affect two basic ratios, signal-to-noise (S/N) and extraneous-input-to-noise (I/N). Tolerable S/N values are discussed for both digital and analog communications systems. These lead to tolerable signal-to-extraneous-input (S/I) ratios, again for digital and analog communications systems, as well as radar and sonar. State-of-the-art limits for transmitters include RF noise emission, spurious emissions, and intermodulation. Receiver limits include adjacent-channel interactions, image, IF, and other spurious responses, including cross modulation, intermodulation, and desensitization. Unintentional emitters and receivers are also discussed. Coupling limitations between undesired sources and receptors are considered from mechanisms including radiation, induction, and conduction.
Keywords :
Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic devices; Electromagnetic interference; Radar; Radio frequency; Signal to noise ratio; Silicon compounds; Sonar; Transmitters;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1981.11951
Filename :
1456219
Link To Document :
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