DocumentCode :
962020
Title :
High-speed response of InAlAs/InGaAs M-S-M photodetectors at 1.3- and 1.5- mu m wavelengths: experiment and theory
Author :
Soole, J.B.D. ; Schumacher, Hermann ; Leblanc, Herve P. ; Bhat, Ritesh ; Koza, M.A.
Author_Institution :
Bellcore, Red Bank, NJ, USA
Volume :
36
Issue :
11
fYear :
1989
fDate :
11/1/1989 12:00:00 AM
Firstpage :
2624
Lastpage :
2625
Abstract :
Summary form only given. The authors report the DC and pulse response, at 1.3- and 1.5- mu m wavelengths, of OMCVD-grown In0.53Ga0.47As/InP metal-semiconductor-metal (M-S-M) photodetectors which use a thin layer of lattice-matched In0.52Al0.48As for barrier enhancement. They also report the results of a computational study of the temporal response of the generic InGaAs M-S-M detector at these wavelengths, indicating how the device dimensions influence the bandwidth. Pulse responses of 55 ps FWHM (full width at half maximum) at 1.53 mu m and 48 ps at 1.31 mu m were obtained with gain switched diode laser pulses, indicating intrinsic bandwidths of approximately 8 and approximately 11 GHz, respectively, with a limiting system response width of approximately 40 ps. The authors present the results of 2D calculations of the transit time limited impulse response of the detector for 1.3- and 1.4- mu m incident radiation.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; infrared detectors; metal-semiconductor-metal structures; photodiodes; transient response; 1.3 micron; 1.5 micron; 11 GHz; 40 ps; 48 ps; 55 ps; 8 GHz; DC response; In0.53Ga0.47As-InP; InAlAs-InGaAs; InP; MSM photodetectors; OMCVD; bandwidth; barrier enhancement; gain switched diode laser pulses; pulse response; temporal response; transit time limited impulse response; Bandwidth; Detectors; Diode lasers; Indium compounds; Indium gallium arsenide; Indium phosphide; Optical pulses; Photodetectors; Space vector pulse width modulation; Time factors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.43749
Filename :
43749
Link To Document :
بازگشت