Title :
Using Software Reliability Growth Models in Practice
Author :
Almering, Vincent ; van Genuchten, Michiel ; Cloudt, Ger ; Sonnemans, Peter J M
Author_Institution :
NXP Semicond., Nijmegen
Abstract :
The amount of software in consumer electronics has grown from thousands to millions of lines of source code over the past decade. Up to a million of these products are manufactured each month for a successful mobile phone or television. Development organizations must meet two challenging requirements at the same time: be predictable to meet market windows and provide nearly fault-free software. Software reliability is the probability of failure-free operation for a specified period of time in a specified environment. The process of finding and removing faults to improve the software reliability can be described by a mathematical relationship called a software reliability growth model (SRGM). Our goal is to assess the practical application of SRGMs during integration and test and compare them with other estimation methods. We empirically validated SRGMs´ usability in a software development environment. During final test phases for three embedded software projects, software reliability growth models predicted remaining faults in the software, supporting management´s decisions.
Keywords :
consumer electronics; program debugging; program testing; project management; software development management; software reliability; SRGM usability; consumer electronics software; embedded software projects; fault-free software; software development environment; software reliability growth models; software stability testing; Application software; Consumer electronics; Embedded software; Manufacturing; Mathematical model; Mobile handsets; Software reliability; TV; Testing; Usability; estimation methods; fault prediction; modeling; software reliability; software testing;
Journal_Title :
Software, IEEE
DOI :
10.1109/MS.2007.182