• DocumentCode
    962265
  • Title

    Modification of transconductance characteristics for ion-implanted GaAs/AlGaAs heterojunction MESFETs

  • Author

    Feng, Ming ; Kaliski, Rafael ; Lau, C.L. ; Ito, C.

  • Volume
    25
  • Issue
    11
  • fYear
    1989
  • fDate
    5/25/1989 12:00:00 AM
  • Firstpage
    713
  • Lastpage
    715
  • Abstract
    Inverted GaAs/AlGaAs heterostructures grown by MOCVD have been used to fabricate conventional ion-implanted MESFETs. Two types of GaAs/AlGaAs heterojunctions are studied. One type has a compositionally graded AlGaAs layer which provides a built-in field and corresponding quantum well at the heterointerface. The other type has a constant-composition AlGaAs layer. 0.5 mu m gate devices fabricated using the ungraded AlGaAs layer show a maximum extrinsic transconductance Gm of 280 mS/mm and a small Gm variation over a gate voltage range of 1.5 V. In comparison, devices fabricated using the graded AlGaAs layer exhibit higher transconductance over all the gate voltages and an enhancement of Gm up to 420 mS/mm at low gate bias.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; aluminium compounds; electric admittance; gallium arsenide; ion implantation; semiconductor quantum wells; 0.5 micron; 280 mS; 420 mS; GaAs-AlGaAs; MOCVD; built-in field; compositionally graded AlGaAs layer; constant-composition AlGaAs layer; gate voltage range; ion implanted heterojunction MESFET; maximum extrinsic transconductance; quantum well; transconductance characteristics;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890483
  • Filename
    24095