• DocumentCode
    962323
  • Title

    On the Complexity of Estimating the Size of a Test Set

  • Author

    Krishnamurthy, Balakrishnan ; Akers, Sheldon B.

  • Author_Institution
    General Electric Research and Development Center, Schenectady, NY 12301.
  • Issue
    8
  • fYear
    1984
  • Firstpage
    750
  • Lastpage
    753
  • Abstract
    Most NP-completeness results for test generation problems involve a reduction to the redundancy problem, which explicitly encodes the satisfiability problem. In this correspondence we investigate the complexity of a more modest problem¿that of estimating the size of a test set under the constraint that the circuit is irredundant. We show that even this constrained problem is NP-hard in the strong sense.
  • Keywords
    Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Linear circuits; Logic testing; Polynomials; Redundancy; Combinational circuits; complexity; redundancy; test sets; testability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1984.5009364
  • Filename
    5009364
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=962323