Title :
On the Complexity of Estimating the Size of a Test Set
Author :
Krishnamurthy, Balakrishnan ; Akers, Sheldon B.
Author_Institution :
General Electric Research and Development Center, Schenectady, NY 12301.
Abstract :
Most NP-completeness results for test generation problems involve a reduction to the redundancy problem, which explicitly encodes the satisfiability problem. In this correspondence we investigate the complexity of a more modest problem¿that of estimating the size of a test set under the constraint that the circuit is irredundant. We show that even this constrained problem is NP-hard in the strong sense.
Keywords :
Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Linear circuits; Logic testing; Polynomials; Redundancy; Combinational circuits; complexity; redundancy; test sets; testability;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.5009364
