• DocumentCode
    962334
  • Title

    Self-Testing Embedded Parity Checkers

  • Author

    Khakbaz, Javad ; McCluskey, Edward J.

  • Author_Institution
    Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science. Stanford University, Stanford, CA 94305.; Memorex Corporation, Santa Clara, CA.
  • Issue
    8
  • fYear
    1984
  • Firstpage
    753
  • Lastpage
    756
  • Abstract
    It is shown that if a 4-by-n binary matrix has four distinct even-parity rows such that each column has exactly two 0´s and two 1´s, then there exists a totally self-checking even-parity checker that is tested by the four rows of this matrix. The utility of this result in designing self-testing embedded parity checkers is described.
  • Keywords
    Automatic testing; Built-in self-test; Electronic equipment testing; Java; Laboratories; Military computing; Pattern matching; Research and development; Shape; System testing; Parity checker; parity tree; totally self-checking;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1984.5009365
  • Filename
    5009365
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=962334