Title :
Self-Testing Embedded Parity Checkers
Author :
Khakbaz, Javad ; McCluskey, Edward J.
Author_Institution :
Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science. Stanford University, Stanford, CA 94305.; Memorex Corporation, Santa Clara, CA.
Abstract :
It is shown that if a 4-by-n binary matrix has four distinct even-parity rows such that each column has exactly two 0´s and two 1´s, then there exists a totally self-checking even-parity checker that is tested by the four rows of this matrix. The utility of this result in designing self-testing embedded parity checkers is described.
Keywords :
Automatic testing; Built-in self-test; Electronic equipment testing; Java; Laboratories; Military computing; Pattern matching; Research and development; Shape; System testing; Parity checker; parity tree; totally self-checking;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.5009365
