DocumentCode
962363
Title
Signature Testing of Sequential Machines
Author
Hassan, Syed Zahoor
Author_Institution
Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University, Stanford, CA 94305.
Issue
8
fYear
1984
Firstpage
762
Lastpage
764
Abstract
A new approach to the testing of sequential machines is presented which employs signature analysis. In the conventional scheme of testing sequential finite state machines, distinguishing and transfer sequences are used. For the purposes of testing sequential machines by signature analysis, a signature distinguishing sequence is defined. An algorithm for augmenting a sequential machine by introducing an extra input is presented. This yields a sequential machine that has a signature distinguishing sequence. The additional cost in terms of the chip area for a programmable logic array (PLA) implementation is calculated.
Keywords
Circuit testing; Combinational circuits; Costs; Hardware; Logic testing; Polynomials; Programmable logic arrays; Sequential analysis; Sequential circuits; System testing; LFSR; sequential machines; signature analysis; testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1984.5009368
Filename
5009368
Link To Document