• DocumentCode
    962363
  • Title

    Signature Testing of Sequential Machines

  • Author

    Hassan, Syed Zahoor

  • Author_Institution
    Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University, Stanford, CA 94305.
  • Issue
    8
  • fYear
    1984
  • Firstpage
    762
  • Lastpage
    764
  • Abstract
    A new approach to the testing of sequential machines is presented which employs signature analysis. In the conventional scheme of testing sequential finite state machines, distinguishing and transfer sequences are used. For the purposes of testing sequential machines by signature analysis, a signature distinguishing sequence is defined. An algorithm for augmenting a sequential machine by introducing an extra input is presented. This yields a sequential machine that has a signature distinguishing sequence. The additional cost in terms of the chip area for a programmable logic array (PLA) implementation is calculated.
  • Keywords
    Circuit testing; Combinational circuits; Costs; Hardware; Logic testing; Polynomials; Programmable logic arrays; Sequential analysis; Sequential circuits; System testing; LFSR; sequential machines; signature analysis; testing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1984.5009368
  • Filename
    5009368