Title :
Empirical formulas for MIS microstrip line parameters
Author_Institution :
Lab. d´Electromagnetisme, Microondes & Optoelectronique, ENSERG, Grenoble, France
fDate :
5/25/1989 12:00:00 AM
Abstract :
A method is proposed to obtain closed-form empirical formulas to calculate the effective dielectric constant, the attenuation constant and the characteristic impedance of a microstrip line on an Si-SiO2 structure for varying strip width and frequency. The formulas are valid in both the slow-wave mode (low frequency) and the skin-effect mode (high frequency). The dielectric mode is not taken into account. for strip widths varying from 30 mu m to 80 mu m, high accuracy was obtained.
Keywords :
MMIC; electric impedance; metal-insulator-semiconductor structures; permittivity; skin effect; strip lines; 30 to 80 micron; HF mode; LF mode; MIS microstrip line parameters; MMIC; Si-SiO 2 structure; attenuation constant; characteristic impedance; closed-form empirical formulas; effective dielectric constant; high frequency; low frequency; monolithic microwave IC; skin-effect mode; slow-wave mode; strip width;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890500
