DocumentCode
962589
Title
Accelerated Life Testing and Reliability of High K Multilayer Ceramic Capacitors
Author
Minford, William J.
Author_Institution
Bell Laboratories, Allentown, PA
Volume
5
Issue
3
fYear
1982
fDate
9/1/1982 12:00:00 AM
Firstpage
297
Lastpage
300
Abstract
The reliability of high K muitilayer ceramic capacitors was evaluated using accelerated life testing. The degradation in insulation resistance was characterized as a function of voltage (two to eight times rated) and temperature (85 to 170°C). The times to failure at a voltage-temperature stress conformed to a iognormai distribution with a standard deviation typically less than 0.5. A small infant mortality population was also observed for some samples. The results were least-squares fit to the following equation:
Keywords
Ceramic capacitors; Life testing; Capacitors; Ceramics; Degradation; High K dielectric materials; High-K gate dielectrics; Insulation; Life estimation; Life testing; Nonhomogeneous media; Voltage;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1982.1135974
Filename
1135974
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