Title :
Accelerated Life Testing and Reliability of High K Multilayer Ceramic Capacitors
Author :
Minford, William J.
Author_Institution :
Bell Laboratories, Allentown, PA
fDate :
9/1/1982 12:00:00 AM
Abstract :
The reliability of high K muitilayer ceramic capacitors was evaluated using accelerated life testing. The degradation in insulation resistance was characterized as a function of voltage (two to eight times rated) and temperature (85 to 170°C). The times to failure at a voltage-temperature stress conformed to a iognormai distribution with a standard deviation typically less than 0.5. A small infant mortality population was also observed for some samples. The results were least-squares fit to the following equation:
Keywords :
Ceramic capacitors; Life testing; Capacitors; Ceramics; Degradation; High K dielectric materials; High-K gate dielectrics; Insulation; Life estimation; Life testing; Nonhomogeneous media; Voltage;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1982.1135974
