• DocumentCode
    962603
  • Title

    Thermal noise in gradual-junction-gate f.e.t.

  • Author

    Rigaud, D. ; Ginter, G. ; Lecoy, G.

  • Author_Institution
    Université des Sciences et Techniques du Languedoc, Centre d´Ã\x89tudes d´Ã\x89lectronique des Solides, Laboratoire associé au CNRS, Montpellier, France
  • Volume
    7
  • Issue
    14
  • fYear
    1971
  • Firstpage
    389
  • Lastpage
    390
  • Abstract
    The letter gives the analytic expressions of the thermal noise existing in the channel of the epitaxial-junction gate field-effect transistor. The results are compared with Van der Ziel´s for an abrupt junction gate.
  • Keywords
    field effect transistors; thermal noise; epitaxial junction gate field effect transistor; impurities distributions; thermal noise;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19710265
  • Filename
    4244753
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=962603