DocumentCode :
962649
Title :
Application of the Finite Element Method to Determine the Electrical Resistance, Inductance, Capacitance parameters for the Circuit Package Enviornment
Author :
Olson, Leonard T.
Author_Institution :
IBM Corp, Endicott, NY, USA
Volume :
5
Issue :
4
fYear :
1982
fDate :
12/1/1982 12:00:00 AM
Firstpage :
486
Lastpage :
492
Abstract :
A finite-element program, Fierce, is used to obtain representative R, L, C electrical parameters for various two-dimensional conductor/dielectric packaging structures. The calculated results of Fierce are compared with an existing program C2D and correlated to hardware measurements. Specific advantages of Fierce are cited for ,modeling complex multilevel wiring packages with mixed dielectrics and several grounds. The concluding example demonstrates the capability of Fierce to characterize nine conductor--five dielectric model(s). The R, L, C outputs are inputed to a circuit analysis program, Astap, to compare the performance advantage of a ground plane located close to the conductors versus a far ground plane for a high performance application (800 ps driver switching speeds).
Keywords :
Capacitance calculations; FEM; Finite-element method (FEM); Hybrid integrated circuit packaging; Inductance calculations; Resistance measurements; Capacitance; Circuits; Conductors; Dielectric measurements; Electric resistance; Electrical resistance measurement; Finite element methods; Hardware; Inductance; Packaging;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1982.1135980
Filename :
1135980
Link To Document :
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