Title :
SEC-BED-DED Codes for Error Control in Byte-Organized Memory Systems
Author :
Dunning, Larry A.
Author_Institution :
Department of Computer Science, Bowling Green State University, Bowling Green, OH 43403.
fDate :
6/1/1985 12:00:00 AM
Abstract :
SEC-ED-DED codes are single error correcting and double error detecting while simultaneously providing byte error detection. SEC-BED-DED codes are constructed for byte lengths of 5 and larger. For many byte lengths and code lengths, these codes require fewer check bits or have implementation advantages when compared to other SEC-BED-DED codes.
Keywords :
Circuit faults; Circuit testing; Computer errors; Decoding; Error correction; Error correction codes; Integrated circuit testing; Logic testing; Parity check codes; Protection; Byte errors; SEC-BED-DED codes; byte organization; error-correcting codes; error-detecting codes; fault tolerance; memories; package failures;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1985.5009409
