• DocumentCode
    962808
  • Title

    Testing analogue functions using m-sequences

  • Author

    Russell, G.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Newcastle Upon Tyne Univ., UK
  • Volume
    29
  • Issue
    21
  • fYear
    1993
  • Firstpage
    1818
  • Lastpage
    1819
  • Abstract
    A prototype systems level approach to testing embedded analogue functions in VLSI circuits is described. The technique is self-contained and can be used for wafer, package and field testing. The technique can be easily integrated into a digital test environment. The fault detection capabilities of the method are demonstrated by simulation results.
  • Keywords
    VLSI; automatic testing; binary sequences; built-in self test; fault location; integrated circuit testing; mixed analogue-digital integrated circuits; BIST; VLSI circuits; digital test environment; embedded analogue functions; fault detection capabilities; field testing; m-sequences;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19931209
  • Filename
    241355
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=962808