• DocumentCode
    962989
  • Title

    The underlying event model for approximating probabilistic dependence among binary events

  • Author

    Keefer, Donald L.

  • Author_Institution
    Dept. of Supply Chain Manage., Arizona State Univ., Tempe, AZ, USA
  • Volume
    51
  • Issue
    2
  • fYear
    2004
  • fDate
    5/1/2004 12:00:00 AM
  • Firstpage
    173
  • Lastpage
    182
  • Abstract
    This paper presents a model for approximating positive probabilistic dependence among binary (success/failure) events in decision, economic evaluation, and risk analysis problems. It is not always feasible to obtain the probabilities needed to completely specify the joint probability structure among the binary events in real-world problems, so simplifying assumptions such as independence that require only the marginal probabilities are frequently employed. The proposed model requires the assessment of only one conditional probability in addition to the marginal probabilities. Extensive numerical studies show that it produces more accurate joint outcome probabilities, expected values, and certainty equivalents than commonly used approximations. Binary events are important in a variety of practical problems, such as exploring geologically related petroleum exploration prospects, conducting related R&D projects, or pursuing related lawsuits. The proposed model addresses a practical need for better modeling of dependence in such problems, and it is operational.
  • Keywords
    probability; research and development; risk analysis; R&D projects; binary event; decision analysis; economic evaluation; numerical studies; portfolio evaluation; probabilistic dependence approximations; project evaluation-selection; project interdependence; risk analysis; underlying event model; Fuel economy; Geology; Marketing and sales; Occupational stress; Petroleum; Portfolios; Research and development; Risk analysis; Supply chain management;
  • fLanguage
    English
  • Journal_Title
    Engineering Management, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9391
  • Type

    jour

  • DOI
    10.1109/TEM.2004.826014
  • Filename
    1288441